发明名称 MANIPULATION OF TRACES FOR DEBUGGING BEHAVIORS OF A CIRCUIT DESIGN
摘要 A viewer shows circuit design activities, displaying a signal, its corresponding trace, and the values of the trace over time. A global zoom-in, zoom-out, and zoom-fit are provided over the value display to adjust the time interval covered within the viewer. Non-linear manipulation of the traces within the viewer enables simultaneous zoomed in display of multiple time intervals, and zoomed out display of other time intervals. The non-linear manipulations may be performed within a same display region by designating zoom groups corresponding to the selection of a designated time period of activities of the circuit. Each zoom group may be scaled independently of other timer periods to zoom in or out of activities occurring within the designated time period. A list of behaviors may also be provided. Selection of a behavior generates a separate signal list for signals associated with the behavior and corresponding traces for enhanced debugging.
申请公布号 US2015100933(A1) 申请公布日期 2015.04.09
申请号 US201314050309 申请日期 2013.10.09
申请人 Jasper Design Automation, Inc. 发明人 Coelho, JR. Claudionor José Nunes;Lin Chien-Liang;Ip Chung-Wah Norris
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A non-transitory computer-readable storage medium containing computer program code, when executed by a computer, causes a computing system to execute a process for circuit design analysis, the computer program code comprising code for: receiving signal traces and circuit design behaviors for a circuit design; generating a behavior list display region that includes a list of the circuit design behaviors; receiving a selection of a first circuit design behavior from the list of the circuit design behaviors, the first circuit design behavior being associated with a group of signals from the circuit design; generating a first signal list display region listing a first group of signals from the circuit design associated with the first circuit design behavior; generating a first trace display region, the trace display region including a first group of the signal traces corresponding to the first group of signals in the first signal list display region; receiving a selection of a second circuit design behavior from the list of the circuit design behaviors, the second circuit design behavior being associated with a second group of signals from the circuit design; updating the first signal list display region by replacing the first group of signals with the second group of signals associated with the second circuit design behavior; and updating the first trace display region by replacing the first group of the signal traces with a second group of the signal traces corresponding to the second group of signals in the first signal list display region.
地址 Mountain View CA US