发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, METHOD FOR PROCESSING SUBSTRATE, SUBSTRATE PROCESSING DEVICE AND RECORDING MEDIUM |
摘要 |
In order to extend the cycle of gas cleaning for a film-forming device, a method for manufacturing a semiconductor device includes: a substrate carry-in process for carrying a substrate into a processing chamber; a film forming process for laminating at least two types of films on the substrate in the processing chamber; a substrate carry-out process for carrying the film laminated substrate out from the processing chamber; an etching process for supplying an etching gas into the processing chamber while the substrate is not in the processing chamber after the substrate carry-out process. The etching process includes a first cleaning process for supplying a fluorine-containing gas activated by plasma excitation into the processing chamber as an etching gas; and a second cleaning process for supplying a fluorine-containing gas activated by heat into the processing chamber as an etching gas. |
申请公布号 |
US2015099373(A1) |
申请公布日期 |
2015.04.09 |
申请号 |
US201314386223 |
申请日期 |
2013.03.22 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
Sano Atsushi;Asai Masayuki;Yonebayashi Masahiro |
分类号 |
H01L21/02;H01J37/32 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a semiconductor device, comprising:
loading a substrate into a processing chamber; forming at least two kinds of films on the substrate within the processing chamber; unloading the substrate having the films formed thereon from the processing chamber; and after unloading the substrate, etching by supplying an etching gas into the processing chamber without any substrate within the processing chamber, the act of etching including a first cleaning of supplying a fluorine-containing gas activated by plasma excitation as the etching gas into the processing chamber, and a second cleaning of supplying a fluorine-containing gas activated by heat as the etching gas into the processing chamber. |
地址 |
Tokyo JP |