发明名称 HETEROSTRUCTURE INCLUDING ANODIC ALUMINUM OXIDE LAYER
摘要 A semiconductor structure including an anodic aluminum oxide layer is described. The anodic aluminum oxide layer can be located between a semiconductor layer and another layer of material. The anodic aluminum oxide layer can include a plurality of pores extending to an adjacent surface of the semiconductor layer. The layer of material can penetrate at least some of the plurality of pores and directly contact the semiconductor layer. In an illustrative embodiment, the layer of material is a conductive material and the anodic aluminum oxide is located at a p-type contact.
申请公布号 WO2015051051(A1) 申请公布日期 2015.04.09
申请号 WO2014US58712 申请日期 2014.10.02
申请人 SENSOR ELECTRONIC TECHNOLOGY, INC. 发明人 SHUR, MICHAEL;SHATALOV, MAXIM, S.;DOBRINSKY, ALEXANDER;GASKA, REMIGIJUS
分类号 H01L33/30 主分类号 H01L33/30
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