Adjusting Sample Holder Orientation For Symmetric Incident Beam and Scattered Beam Geometry to Compensate for Refraction Index Related Distortions

摘要

An apparatus with an electromagnetic radiation source generates an incident-beam. A sample container accommodates a sample, receives the incident beam for interaction with the sample, and enables a scattered beam, which is to be detected, to propagate out of the sample container. An electromagnetic radiation detector detects the scattered beam which is received from the sample container. The sample container is oriented with regard to a direction of the incident beam so that an incident trajectory of the incident beam directly before propagating into the sample container up to a symmetry axis of the sample container is symmetric with a scattered trajectory of the scattered beam, which is to be detected, from the symmetry axis up to a position of the scattered beam directly after having left the sample container, such that the scattered trajectory outside of the sample container is independent of a refraction index of the sample container and of the sample.

主权项

1. An apparatus for analyzing a sample, the apparatus comprising:
an electromagnetic radiation source configured for generating an incident electromagnetic radiation beam; a sample container configured for accommodating the sample to be analyzed, shaped to have a symmetry axis, arranged for receiving the incident electromagnetic radiation beam to propagate into the sample container for interaction with the sample, and arranged for enabling a scattered electromagnetic radiation beam, which is to be detected, to propagate out of the sample container; and an electromagnetic radiation detector configured for detecting the scattered electromagnetic radiation beam to be detected which is received from the sample container; wherein the sample container is oriented with regard to a direction of the incident electromagnetic radiation beam so that an incident trajectory of the incident electromagnetic radiation beam directly before propagating into the sample container up to the symmetry axis is symmetric with respect to a scattered trajectory of the scattered electromagnetic radiation beam, which is to be detected, from the symmetry axis up to a position of the scattered electromagnetic radiation directly after having left the sample container, such that the scattered trajectory outside of the sample container is independent of a refraction index of the sample container and of the sample.