| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an inexpensive system capable of rapidly measuring strain on a transparent film.SOLUTION: A strain measurement system includes: a plurality of light sources (1through 1); a plurality of polarizing filters (2through 2) of different types alternately arranged with respect to the plurality of light sources (1through 1); an image sensor 3 for capturing an image of light transmitting through the polarizing filters (2through 2) and a transparent film 200; an analyzer 4 for analyzing strain on the transparent film 200 using the transmitted light image captured by the image sensor 3; and a light emission control unit 5 which sequentially turns on each group of light sources with a different type of polarizing filter out of the plurality of light sources (1through 1). Sequential switching through the groups of light sources (1through 1) to be turned on enables more rapid switching of polarization angles compared to the case with a rotating polarizing plate and high-speed measurement of retardation on the transmitted light, caused by strained portions, and an optical axis direction using one general-purpose image sensor 3.</p> |
