DE-EMBED PROBE, TEST AND MEASUREMENT SYSTEM AND VOLTAGE MEASUREMENT METHOD

摘要

PROBLEM TO BE SOLVED: To eliminate the need for load-switch elements.SOLUTION: A de-embed probe 100 includes: two input terminals 114 and 116 that can connect to a device under test; a memory 108; a signal generator 102 connected to the input terminals 114 and 116 and configured to generate and provide a test signal; and a controller 110 connected to the signal generator 102 and configured to control the signal generator 102. The probe 100 may be used in a test and measurement system including a test and measurement instrument. The test and measurement instrument receives an output signal of the probe 100. A processor in the test and measurement instrument controls the controller 110.