发明名称 TRENCH GATE TRENCH FIELD PLATE VERTICAL MOSFET
摘要 In described examples, a semiconductor device (100) having a vertical drain extended MOS transistor (110) may be formed by forming deep trench structures (104) to define at least one vertical drift region (108) of the transistor (110), so that each vertical drift region (108) is bounded on at least two opposite sides by the deep trench structures (104). The deep trench structures (104) are spaced to form RESURF regions for the drift region (108). Trench gates (114) are formed in trenches in a substrate (102) over the vertical drift regions (108). Body regions (118) are located in the substrate (102) over the vertical drift regions (108).
申请公布号 WO2015050789(A1) 申请公布日期 2015.04.09
申请号 WO2014US57766 申请日期 2014.09.26
申请人 TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED 发明人 DENISON, MARIE;PENDHARKAR, SAMEER;MATHUR, GURU
分类号 H01L27/088;H01L29/78 主分类号 H01L27/088
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