发明名称 HIGH RELIABILITY ETCHED-FACET PHOTONIC DEVICES
摘要 Semiconductor photonic device surfaces are covered with a dielectric or a metal protective layer. The protective layer covers the entire device, including regions near facets at active regions, to prevent bare or unprotected semiconductor regions, thereby to form a very high reliability etched facet photonic device.
申请公布号 EP1854189(B1) 申请公布日期 2015.04.08
申请号 EP20060735363 申请日期 2006.02.17
申请人 BINOPTICS CORPORATION 发明人 BEHFAR, ALEX, A.
分类号 H01S5/028;G02F1/17;H01S5/02;H01S5/16;H01S5/22;H01S5/323 主分类号 H01S5/028
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