发明名称 X-RAY INSPECTION METHOD AND DEVICE
摘要 <p>A first X-ray image is obtained by imaging a target in a first direction and at a first elevation angle, and a second X-ray image is obtained by imaging the target in a second direction and at a second elevation angle. Based on these two X-ray images, cross-section data of the target is obtained. The first and second X-ray images are converted into first and second thickness data, and first cross-section data based on a first surface side of the target and second cross-section data based on a second surface side of the target are obtained based on the first thickness data. Similar third cross-section data and four cross-section data are obtained based on the second thickness data. The cross-section data of the target is obtained by partially extracting and synthesizing cross-section data of a highly reliable region from these pieces of cross-section data.</p>
申请公布号 EP2778662(A4) 申请公布日期 2015.04.08
申请号 EP20110875360 申请日期 2011.11.09
申请人 YAMAHA HATSUDOKI KABUSHIKI KAISHA 发明人 SUZUKI, YOSHIKUNI
分类号 G01N23/04;G01B15/04;G06T11/00 主分类号 G01N23/04
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