| 摘要 |
According to the present invention, an apparatus for measuring a thermoelectric device includes: a high temperature heater controlling a temperature of a first side surface of a sample; a low temperature heater controlling a temperature of a second side surface of the sample; a fine-adjustment heater controlling the temperature of the first side surface of the sample with a unit smaller than the high temperature heater; a temperature control and voltage measurement unit controlling the high temperature heater, the low temperature heater, and the fine-adjustment heater and measuring voltages of the first and the second side surfaces of the sample; and a thermal conductivity measurement unit measuring thermal conductivity of the sample using high temperature output voltage generated on the first side surface of the sample and low temperature output voltage generated on the second side surface of the sample. |
