| 摘要 |
<p>An optical wave distance measurement device shifts a binarizing threshold value, used during binarization of a received light signal, at a light projecting period and a non-light projecting period for a light projecting circuit (1). In addition, the optical wave distance measurement device: arranges measurement and reference laser diodes (LD1, LD2) for the light projecting circuit (1) together in near vicinity and measurement and reference dual gate MOSFETs (Q1 Q2) that drive same together in near vicinity, such that temperatures for the same type become similar; drives both the measurement and reference laser diodes (LD1, LD2) using the same drive current determined by the monitor current for one of the measurement and reference laser diodes (LD1, LD2); and causes a common light receiving circuit (2) to receive both the projected measurement light signal and the projected reference light signal.</p> |
