| 摘要 |
<p>The present invention relates to a retardation film having anti-wavelength dispersion properties in the plane and thickness directions to satisfy the following equitation (1) to (4) and a method for producing the same. The retardation film having anti-wavelength dispersion properties comprises: a first layer which has positive phase difference characteristics and is biaxially oriented; and a second layer which has negative phase difference characteristics and is biaxially oriented. Equitation (1): R_in,b(450)/R_in,b(550) > R_in,a(450)/R_in,a(550); Equitation (2): R_th,b(450)/R_th,b(550) > R_th,a(450)/R_th,a(550); Equitation (3): R_in,a(550) > R_in,b(550); Equitation (4):¦R_th,a(550)¦>¦R_th,b(550)¦. In the above equitation (1) to (4), R_in,a(450) and R_in,a(550) are the retardation value of the first layer in the plane direction, measured in each wavelength of 450 nm and 550 nm; R_in,b(450) and R_in,b(550) are the retardation value of the second layer in the plane direction, measured in each wavelength of 450 nm and 550 nm; R_th,a(450) and R_th,a(550) are the retardation value of the first layer in the thickness direction, measured in each wavelength of 450 nm and 550 nm; R_th,b(450) and R_th,b(550) are the retardation value of the second layer in the thickness direction, measured in each wavelength of 450 nm and 550 nm; and¦R_th,a(550)¦and¦R_th,b(550)¦are the absolute value of each R_th,a(550) and R_th,b(550).</p> |
