发明名称 Small-grain three-dimensional memory
摘要 The present invention discloses a small-grain three-dimensional memory (3D-MSG). Each of its memory cells comprises a thin-film diode with critical dimension no larger than 40 nm. The thin-film diode comprises at least a small-grain material, whose grain size G is substantially smaller than the diode size D. The small-grain material is preferably a nano-crystalline material or an amorphous material. The critical dimension f of the small-grain diode is smaller than the critical dimension F of the single-crystalline transistor.
申请公布号 US9001555(B2) 申请公布日期 2015.04.07
申请号 US201313848018 申请日期 2013.03.20
申请人 ChengDu HaiCun IP Technology LLC 发明人 Zhang Guobiao
分类号 G11C11/00;G11C11/36;G11C17/18;G11C11/34;G11C5/02;G11C17/16;G11C11/56;G11C13/00;G11C17/10 主分类号 G11C11/00
代理机构 代理人
主权项 1. A small-grain three-dimensional memory, comprising: a substrate level comprising a semiconductor substrate, said substrate level further comprising a plurality of functional transistors; and at least a first memory level stacked above said semiconductor substrate and coupled to said substrate level through a plurality of inter-level vias, said memory level comprising a plurality of memory cells, wherein each of said memory cells comprises a small-grain diode with a critical dimension no larger than 40 nm, a grain size of said small-grain diode being substantially smaller than a small-grain diode size; wherein the critical dimension of said first memory level is smaller than the critical dimension of said substrate level.
地址 ChengDu, SiChuan CN