High-frequency signal processor and wireless communication system

摘要

There is a need to reduce secondary intermodulation distortion that may occur in a reception circuit of a high-frequency signal processor and a wireless communication system having the same. In test mode, for example, a test signal generating circuit TSGEN generates a test signal RFtst at f_tx ±0.5 MHz. The test signal RFtst is input to a mixer circuit MIXrx_I (MIXrx_Q). A correction circuit block CALBK detects an IM2 component resulting from the MIXrx_I (MIXrx_Q). The CALBK varies a differential balance for the MIXrx_I (MIXrx_Q) and concurrently monitors a phase for the IM2 component resulting from MIXrx_I (MIXrx_Q). The CALBK searches for the differential balance corresponding to a transition point that allows the phase to transition by approximately 180°. The MIXrx_I (MIXrx_Q) operates in normal mode using the differential balance as a search result.

主权项

1. A high-frequency signal processor provided with a first operation mode and a second operation mode, the high-frequency signal processor comprising:
a test signal generating circuit that generates a test signal having a first frequency component and a second frequency component; a first switch that transmits a signal received as a first signal at an antenna in the first operation mode and transmits the test signal as the first signal in the second operation mode; a mixer circuit that includes a differential circuit capable of correcting a differential balance within a specified variable range and down-converts the first signal to a second signal having a frequency band lower than the first signal; a phase detection portion that extracts a third signal from the second signal in the second operation mode, the third signal having a frequency component equivalent to a difference between the first frequency component and the second frequency component, and detects a phase for the third signal; a control portion that changes the differential balance for the mixer circuit according to a detection result from the phase detection portion, wherein the mixer circuit operates in the first operation mode while the differential balance is set to a first correction value within a variable range, and wherein the control portion, in the second operation mode, varies the differential balance and concurrently searches for a transition point allowing a phase for the third signal to transition by approximately 180° before and after varying the differential balance within a minimum fluctuation range and supplies the mixer circuit with the first correction value, namely, the differential balance corresponding to the transition point; an analog-digital converter circuit provided after the mixer circuit; a baseband circuit that performs a specified baseband process: and a second switch that selects one out of transmitting an output from the analog-digital converter circuit to the baseband circuit and transmitting the output from the analog-digital converter circuit to the phase detection portion, wherein the phase detection portion receives the second signal as a digital signal via the second switch, wherein the test signal generating circuit includes: a test local signal generating circuit that generates a test local signal having a specified frequency; a test baseband signal generating circuit that generates a test baseband signal having a frequency equivalent to a difference between the first frequency component and the second frequency component; a divider circuit that divides the test baseband signal into two; and a test mixer circuit that up-coverts an output signal from the divider circuit using the test local signal, and wherein the phase detection portion includes:
a digital filter circuit that extracts the third signal;a digital amplifier circuit that amplifies an output signal from the digital filter circuit;a test analog-digital converter circuit that converts the test baseband signal into a digital signal: anda phase detection circuit that detects a phase for an output signal from the digital amplifier circuit with reference to a phase for an output signal from the test analog-digital converter circuit.