发明名称 Radiation imaging system
摘要 An X-ray imaging system is provided with an X-ray source (11), first and second absorption gratings (31, 32), and a flat panel detector (FPD) (30), and obtains a phase contrast image of an object H by performing imaging while moving the second absorption grating (32) in x direction relative to the first absorption grating (31). The following mathematical expression is satisfied where p1′ denotes a period of a first pattern image at a position of the second absorption grating (32), and p2′ denotes a substantial grating pitch of the second absorption grating (32), and DX denotes a dimension, in the x-direction, of an X-ray imaging area of each pixel of the FPD (30). Here, “n” denotes a positive integer. DX≠n×(p1′×p2′)/|p1′−p2′|
申请公布号 US9001969(B2) 申请公布日期 2015.04.07
申请号 US201113522010 申请日期 2011.02.02
申请人 Fujifilm Corporation 发明人 Murakoshi Dai;Tada Takuji;Agano Toshitaka;Takahashi Kenji
分类号 G01N23/00;G01N23/04;A61B6/02;A61B6/00;G21K1/06;A61B6/03;A61B6/06 主分类号 G01N23/00
代理机构 McGinn IP Law Group, PLLC. 代理人 McGinn IP Law Group, PLLC.
主权项 1. A radiation imaging system comprising: a first grating having two or more radiation shield members extending in a first direction and arranged at a first pitch in a second direction orthogonal to the first direction, radiation emitted from a radiation source passing through the first grating to generate a first periodic pattern image; a second grating having two or more radiation shield members extending in a first direction and arranged at a second pitch in the second direction, the radiation shield members of the second grating partly shielding the first periodic pattern image to generate a second periodic pattern image; a scanning section for moving at least one of the first grating and the second grating relative to the other in the second direction at a predetermined pitch; a radiation image detector for detecting the second periodic pattern image as an image signal; a processing section for imaging phase information based on the image signal obtained by the radiation image detector; wherein a mathematical expression DX≠n×(p1′×p2′)/|p1′−p2′| is satisfied where p1′ denotes a period of the first periodic pattern image relative to the second direction at a position of the second grating, and p2′ denotes a substantial grating pitch of the second grating relative to the second direction, and DX denotes a dimension of a radiation imaging area of each pixel in the radiation image detector relative to the second direction, and n denotes a positive integer.
地址 Tokyo JP