发明名称 Method for fabricating emitter
摘要 A method for fabricating a sharpened needle-like emitter, the method including: electrolytically polishing an end portion of an electrically conductive emitter material so as to be tapered toward a tip portion thereof; performing a first etching in which the electrolytically polished part of the emitter material is irradiated with a charged-particle beam to form a pyramid-like sharpened part having a vertex including the tip portion; performing a second etching in which the tip portion is further sharpened through field-assisted gas etching, while observing a crystal structure at the tip portion by a field ion microscope and keeping the number of atoms at a leading edge of the tip portion at a predetermined number or less; and heating the emitter material to arrange the atoms at the leading edge of the tip portion of the sharpened part in a pyramid shape.
申请公布号 US8999178(B2) 申请公布日期 2015.04.07
申请号 US201414278760 申请日期 2014.05.15
申请人 Hitachi High-Tech Science Corporation 发明人 Sugiyama Yasuhiko;Aita Kazuo;Aramaki Fumio;Kozakai Tomokazu;Matsuda Osamu;Yasaka Anto
分类号 C25F3/00;H01J27/02;H01J9/02;H01J1/15;H01J1/304;H01J9/04;H01J37/08;H01J37/305;H01J37/26 主分类号 C25F3/00
代理机构 Adams & Wilks 代理人 Adams & Wilks
主权项 1. A method for fabricating a sharpened needle-like emitter, the method comprising: electrolytically polishing an end portion of an electrically conductive emitter material so as to be tapered toward a tip portion thereof; performing a first etching in which the electrolytically polished part of the emitter material is irradiated with a charged-particle beam to form a pyramid-like sharpened part having a vertex including the tip portion; and performing a second etching in which the tip portion of the sharpened part is further sharpened through field-assisted gas etching, while observing a crystal structure at the tip portion of the sharpened part by a field ion microscope and keeping the number of atoms at a leading edge of the tip portion of the sharpened part at a predetermined number or less.
地址 JP