发明名称 Method to form finFET/trigate devices on bulk semiconductor wafers
摘要 A method for fabricating a finFET device having an insulating layer that insulates the fin from a substrate is described. The insulating layer can prevent leakage current that would otherwise flow through bulk semiconductor material in the substrate. The structure may be fabricated starting with a bulk semiconductor substrate, without the need for a semiconductor-on-insulator substrate. Fin structures may be formed by epitaxial growth, which can improve the uniformity of fin heights in the devices.
申请公布号 US8999815(B2) 申请公布日期 2015.04.07
申请号 US201414478347 申请日期 2014.09.05
申请人 STMicroelectronics, Inc.;International Business Machines Corporation 发明人 Liu Qing;Wang Junli
分类号 H01L21/44;H01L21/8234;H01L21/306;H01L21/02;H01L29/66;H01L21/308 主分类号 H01L21/44
代理机构 Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A. 代理人 Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
主权项 1. A method for making a fin-FET, the method comprising: depositing a first layer comprising sacrificial material on a substrate; depositing a second layer of a first semiconductor material over the first layer; forming a plurality of fins for one or more fin-FETs in the second layer; and removing at least portions of the first layer to form first voids under the plurality of fins.
地址 Coppell TX US