发明名称 |
Method to form finFET/trigate devices on bulk semiconductor wafers |
摘要 |
A method for fabricating a finFET device having an insulating layer that insulates the fin from a substrate is described. The insulating layer can prevent leakage current that would otherwise flow through bulk semiconductor material in the substrate. The structure may be fabricated starting with a bulk semiconductor substrate, without the need for a semiconductor-on-insulator substrate. Fin structures may be formed by epitaxial growth, which can improve the uniformity of fin heights in the devices. |
申请公布号 |
US8999815(B2) |
申请公布日期 |
2015.04.07 |
申请号 |
US201414478347 |
申请日期 |
2014.09.05 |
申请人 |
STMicroelectronics, Inc.;International Business Machines Corporation |
发明人 |
Liu Qing;Wang Junli |
分类号 |
H01L21/44;H01L21/8234;H01L21/306;H01L21/02;H01L29/66;H01L21/308 |
主分类号 |
H01L21/44 |
代理机构 |
Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A. |
代理人 |
Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A. |
主权项 |
1. A method for making a fin-FET, the method comprising:
depositing a first layer comprising sacrificial material on a substrate; depositing a second layer of a first semiconductor material over the first layer; forming a plurality of fins for one or more fin-FETs in the second layer; and removing at least portions of the first layer to form first voids under the plurality of fins. |
地址 |
Coppell TX US |