发明名称 Semiconductor device and method of forming thermally conductive layer between semiconductor die and build-up interconnect structure
摘要 A semiconductor device has a thermally conductive layer with a plurality of openings formed over a temporary carrier. The thermally conductive layer includes electrically non-conductive material. A semiconductor die has a plurality of bumps formed over contact pads on the die. The semiconductor die is mounted over the thermally conductive layer so that the bumps are disposed at least partially within the openings in the thermally conductive layer. An encapsulant is deposited over the die and thermally conductive layer. The temporary carrier is removed to expose the bumps. A first interconnect structure is formed over the encapsulant, semiconductor die, and bumps. The bumps are electrically connected to the first interconnect structure. A heat sink or shielding layer can be formed over the semiconductor die. A second interconnect structure can be formed over the encapsulant and electrically connected to the first interconnect structure through conductive vias formed in the encapsulant.
申请公布号 US8999760(B2) 申请公布日期 2015.04.07
申请号 US201213492687 申请日期 2012.06.08
申请人 STATS ChipPAC, Ltd. 发明人 Pagaila Reza A.;Lin Yaojian;Koo Jun Mo
分类号 H01L21/56;H01L23/538;H01L23/31;H01L23/36;H01L23/498;H01L23/552;H01L23/00;H05K1/02;H05K1/18;H01L23/29;H01L23/367;H01L23/544 主分类号 H01L21/56
代理机构 Patent Law Group: Atkins and Associates, P.C. 代理人 Atkins Robert D.;Patent Law Group: Atkins and Associates, P.C.
主权项 1. A method of making a semiconductor device, comprising: forming a thermally conductive layer including an opening in the thermally conductive layer, the thermally conductive layer being electrically non-conductive; providing a semiconductor die; disposing the semiconductor die over the thermally conductive layer; and depositing an encapsulant over the semiconductor die and thermally conductive layer.
地址 Singapore SG