发明名称 Capacitor and register of semiconductor device, memory system including the semiconductor device, and method of manufacturing the semiconductor device
摘要 A capacitor of a semiconductor device includes a capacitor structure configured to include electrode layers and dielectric layers alternately stacked, edge regions each stepwise patterned, and a central region disposed between the edge regions, sacrificial layers disposed within the respective electrode layers in the edge regions of the capacitor structure, and support plugs formed in the central region of the capacitor structure and configured to penetrate the electrode layers and the dielectric layers.
申请公布号 US9000563(B2) 申请公布日期 2015.04.07
申请号 US201414527170 申请日期 2014.10.29
申请人 SK Hynix Inc. 发明人 Park Sun Mi;Oh Sang Hyun;Lee Sang Bum
分类号 H01L21/02;H01L29/40;H01L21/20;H01L21/44;H01L49/02;H01L27/108 主分类号 H01L21/02
代理机构 William Park & Associates Patent Ltd. 代理人 William Park & Associates Patent Ltd.
主权项 1. A method of forming a capacitor of a semiconductor device; the method comprising: forming a capacitor structure on which edge regions each stepwise patterned and a central region between the edge regions are defined, and configured to comprise sacrificial layers and dielectric layers alternately stacked and support plugs placed in the central region; forming first slits, each placed between the support plugs of the central region, and one or more second slits placed in the edge regions by etching the sacrificial layers and the dielectric layers; etching the sacrificial layers exposed in the first slits and the second slits so that the sacrificial layers of the central region are fully removed and the sacrificial layers of the edge regions remain partially; and forming electrode layers for the capacitor by filling the etched regions of the sacrificial layers with a conductive layer.
地址 Gyeonggi-do KR