发明名称 MEMORY DEVICES AND METHOD OF FABRICATING SAME
摘要 A device comprises a control gate structure over a substrate, a memory gate structure over the substrate, wherein the memory gate structure comprises a memory gate electrode and a memory gate spacer and the memory gate electrode is an L-shaped structure, a charge storage layer formed between the control gate structure and the memory gate structure, a first spacer along a sidewall of the memory gate structure, a second spacer over a top surface of the memory gate structure, a first drain/source region formed in the substrate and adjacent to the memory gate structure and a second drain/source region formed in the substrate and adjacent to the control gate structure.
申请公布号 KR20150035451(A) 申请公布日期 2015.04.06
申请号 KR20140129295 申请日期 2014.09.26
申请人 타이완 세미콘덕터 매뉴팩쳐링 컴퍼니 리미티드 发明人 우 창 밍;리우 시-창;차이 치아-슝
分类号 H01L21/8247;H01L27/115;H01L29/788 主分类号 H01L21/8247
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