发明名称 METHODS AND APPARATUS FOR X-RAY DIFFRACTION
摘要 Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analysed using this method. For example, in a geological context, whole rock samples become amenable to analysis. A composite diffraction spectrum can be produced using information from different recorded spectra in different energy sub-ranges. The composite spectrum excludes fluorescence signals that would otherwise obscure the diffraction signals.
申请公布号 US2015092921(A1) 申请公布日期 2015.04.02
申请号 US201314394971 申请日期 2013.04.15
申请人 University of Leicester 发明人 Hansford Graeme Mark
分类号 G01N23/20;G01N23/207;G01N23/203 主分类号 G01N23/20
代理机构 代理人
主权项 1. A method of inspecting a material sample by X-ray diffraction wherein the sample is irradiated with a beam of X-ray radiation from a source with a range of photon energies, and wherein a plurality of energy-resolved spectra are obtained from radiation diffracted by the sample, wherein a plurality of energy-resolved spectra are obtained using different settings of source energy, whereby at least one of said spectra excludes a fluorescence signal that is present in another of said spectra.
地址 Leicester GB
您可能感兴趣的专利