发明名称 CUTTING TEST APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To easily cut a material to be cut at uniform thickness in a cutting test apparatus for cutting a part of the material to be cut.SOLUTION: A cutting test apparatus for cutting a part of a material to be cut comprises: a cutting tool arranged by being brought into contact with the material to be cut; a first holding tool for movably holding the cutting tool and one side of the material to be cut in a state that the cutting tool arranged is brought into contact with the material to be cut; and a holding tool 2 for fixing and holding the cutting tool and the other side of the material to be cut so that these do not move for a moving part.</p>
申请公布号 JP2015062011(A) 申请公布日期 2015.04.02
申请号 JP20140165363 申请日期 2014.08.15
申请人 IHI CORP 发明人 KITAGAWA JUNICHI;IWASAKI TAKAYUKI
分类号 G01N3/58 主分类号 G01N3/58
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