发明名称 WAFER PROCESSING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE BY USING THE SAME
摘要 A wafer processing method, by which a device wafer may be aligned and bonded to a carrier wafer to perform a back grinding process for the device wafer and may be separated from the carrier wafer after performing the back grinding process, and a method of manufacturing a semiconductor device by using the wafer processing method are provided. The wafer processing method includes: disposing a first magnetic material on a front side of a wafer and disposing a second magnetic material on a carrier wafer, wherein a surface of the first magnetic material and a surface of the second magnetic material, which face each other, have opposite polarities; aligning and bonding the wafer to the carrier wafer by magnetic attraction between the first magnetic material and the second magnetic material; grinding a back side of the wafer to make the wafer thin; and separating the wafer from the carrier wafer.
申请公布号 US2015093880(A1) 申请公布日期 2015.04.02
申请号 US201414497382 申请日期 2014.09.26
申请人 Samsung Electronics Co., Ltd. 发明人 Ji Sang-wook;Mun Hyoung-yol;Park Yeong-Iyeol;Cho Tae-je
分类号 H01L21/683;H01L21/768;H01L21/304 主分类号 H01L21/683
代理机构 代理人
主权项 1. A wafer processing method comprising: disposing a first magnetic material on a front side of a wafer and disposing a second magnetic material on a carrier wafer, wherein an outwardly facing surface of the first magnetic material and an outwardly facing surface of the second magnetic material have opposite polarities; positioning the wafer and the carrier wafer relative to one another such that the outwardly facing surface of the first magnetic material faces the outwardly facing surface of the second magnetic material; aligning and bonding the wafer to the carrier wafer by magnetic attraction between the first magnetic material and the second magnetic material; grinding a back side of the wafer to make the wafer thin; and separating the wafer from the carrier wafer.
地址 Suwon-si KR