发明名称 SELF-ALIGNED VIAS FORMED USING SACRIFICIAL METAL CAPS
摘要 A method including forming a sacrificial metal cap on a metal line formed in a first dielectric layer; forming a second dielectric layer on the first dielectric layer; removing the sacrificial metal cap selective to the second dielectric layer and metal line to form a cap opening; forming a dielectric cap in the cap opening and on the metal line; forming an interconnect dielectric layer over the dielectric cap and the second dielectric layer; forming an interconnect opening in the interconnect dielectric layer; removing a portion of the dielectric cap exposed by the interconnect opening selective to the interconnect dielectric layer, the second dielectric layer, and the metal line; and forming an interconnect structure in the interconnect opening, the interconnect structure comprising a contact line above a via, the via having an upper via portion with angled sidewalls and a lower via portion with substantially vertical sidewalls.
申请公布号 US2015091181(A1) 申请公布日期 2015.04.02
申请号 US201314041187 申请日期 2013.09.30
申请人 International Business Machines Corporation 发明人 Li Juntao;Yang Chih-Chao;Yin Yunpeng
分类号 H01L21/768;H01L23/48 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method comprising: forming a sacrificial metal cap on a metal line formed in a first dielectric layer; forming a second dielectric layer on the first dielectric layer, the second dielectric layer being adjacent to and contacting a sidewall of the sacrificial metal cap; removing the sacrificial metal cap selective to the second dielectric layer and metal line to form a cap opening, the cap opening having substantially the same width as the metal line; forming a dielectric cap in the cap opening and on the metal line; and forming an interconnect dielectric layer over the dielectric cap and the second dielectric layer.
地址 Armonk NY US