发明名称 SEMICONDUCTOR DEVICE
摘要 In a semiconductor device in which a reference voltage is generated by a reference voltage generation circuit, and the same reference voltage generated is used in a plurality of circuit units for the purpose of generating a voltage, a sampling and holding circuit of the reference voltage is provided in order to provide a standard voltage to the circuit units. A sampling and holding control circuit that controls the sampling and holding circuit instructs the sampling and holding circuit to perform a sampling operation of the reference voltage in case that the semiconductor device operates in a state where power supply noise of the reference voltage generation circuit falls within a predetermined range, and instructs the sampling and holding circuit to perform a holding operation of the reference voltage in case that the semiconductor device operates in a state where the power supply noise exceeds the predetermined range.
申请公布号 US2015091829(A1) 申请公布日期 2015.04.02
申请号 US201414491994 申请日期 2014.09.20
申请人 RENESAS SP DRIVERS INC. 发明人 ENDO Kazuya
分类号 G05F3/16;G06F3/041;G09G3/36;H03M1/12;G11C5/14 主分类号 G05F3/16
代理机构 代理人
主权项 1. A semiconductor device comprising: a first circuit unit; a reference voltage generation circuit that generates a reference voltage; a sampling and holding circuit of the reference voltage; a sampling and holding control circuit that controls the sampling and holding circuit; and a plurality of second circuit units that operate by inputting the reference voltage sampled and held by the sampling and holding circuit, wherein the sampling and holding control circuit instructs the sampling and holding circuit to perform a sampling operation of the reference voltage in case that the semiconductor device operates in a state where power supply noise of the reference voltage generation circuit falls within a predetermined range, and instructs the sampling and holding circuit to perform a holding operation of the reference voltage in case that the semiconductor device operates in a state where the power supply noise exceeds a predetermined range.
地址 Tokyo JP