发明名称 ATOMIC OSCILLATOR, ELECTRONIC APPARATUS, AND MOVING OBJECT
摘要 An atomic oscillator includes a gas cell, a semiconductor laser, a light detector, a bias current control section controlling a bias current based on intensity of light detected by the light detector, a memory, and an MPU. The MPU sweeps the bias current and stores a value of the bias current and a value of the intensity of the light when the intensity of the detected light shifts from a decrease to an increase and re-sweeps to set the bias current based on the value of the bias current stored in the memory after the sweep, compares the value of the intensity of the detected light with the value of the intensity of the light stored in the memory while the bias current control section controls the bias current, and determines whether to perform the sweep again in accordance with the comparison.
申请公布号 US2015091660(A1) 申请公布日期 2015.04.02
申请号 US201414496472 申请日期 2014.09.25
申请人 Seiko Epson Corporation 发明人 TANAKA Noriaki;CHINDO Koji;YOSHIDA Hiroyuki;MAKI Yoshiyuki
分类号 H03L1/00;H03L5/00 主分类号 H03L1/00
代理机构 代理人
主权项 1. An atomic oscillator comprising: a cell which encapsulates metal atoms therein; a light source which generates light for irradiation of the cell; a light detecting section which detects light penetrating through the cell; a bias current control section which controls a bias current to be supplied to the light source based on intensity of light detected by the light detecting section; a storage section; and a bias current setting section which performs sweep processing of sweeping the bias current and storing on the storage section a value of the bias current and a value of the intensity of the light when the intensity of the light detected by the light detecting section shifts from a decrease to an increase and re-sweep determination processing of setting the bias current based on the value of the bias current stored on the storage section after the sweep processing, comparing the value of the intensity of the light detected by the light detecting section with the value of the intensity of the light stored on the storage section in a state where the bias current control section controls the bias current, and determining whether or not to perform the sweep processing again in accordance with a comparison result.
地址 Tokyo JP