发明名称 Bimaterial interface position measurement system
摘要 <p>Provided is a system for measuring the position of a media interface which can measure the position of a media interface between an object to be measured and a radio wave space based on the transmission time of radio waves. The system for measuring the position of a media interface comprises: a structure; a radio wave transmission and reception device for transmitting and receiving the radio waves in the radio wave space; and an operation device for implementing the position measurement of the object to be measured based on the operation control of the radio wave transmission and reception device and the radio waves that the radio wave transmission and reception device receives. Multiple radio wave reflection units capable of detecting the position from the radio wave transmission and reception device are installed in the radio wave space of the structure. The operation device comprises a radio wave time measurement unit for measuring a first diffusion time series T_k (k=1, 2, ..., and N) when the radio waves transmitted by the radio wave transmission and reception device toward the object to be measured reaches the radio wave reflection unit and a second transmission time T_n when the radio waves reach the interface with the object to be measured; and a position measurement unit for measuring the position of a media boundary between the object to be measured and the radio wave space based on the measured diffusion time.</p>
申请公布号 KR20150034091(A) 申请公布日期 2015.04.02
申请号 KR20140120404 申请日期 2014.09.11
申请人 发明人
分类号 G01F23/284;G01S13/08 主分类号 G01F23/284
代理机构 代理人
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