发明名称 |
FAULT DETECTION IN DUAL MICROPROCESSOR ELECTRONIC TRIP UNIT |
摘要 |
The invention relates to a fault detection method and system in an Electronic Trip Unit (ETU). An ETU includes a Protection Function (PF) and a Metering Function (MF), each of the PF and MF measuring in parallel the same one or more power line parameters. A comparator compares the first measurement and the second measurement and outputs a fault signal when a disagreement is detected with a given level of accuracy between the first measurement and the second measurement. At least one further comparator may be used that compares the first measurement and the second measurement, and a voter circuit that collects signals resulting from each said comparing and detects a fault when at least one fault signal exists among said collected signals. |
申请公布号 |
WO2015047123(A1) |
申请公布日期 |
2015.04.02 |
申请号 |
WO2013RU00836 |
申请日期 |
2013.09.25 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
DORRER, JOHANN;PARFENOV, STANISLAV SERGEYEVICH;VINOGRADOV, SERGEY VALERIEVICH;NIKOLAEV, MAXIM ALEXANDROVICH |
分类号 |
H02H3/04;G01R31/327;G05B23/02;H01H47/00;H02H1/00;H02H3/05 |
主分类号 |
H02H3/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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