发明名称 FAULT DETECTION IN DUAL MICROPROCESSOR ELECTRONIC TRIP UNIT
摘要 The invention relates to a fault detection method and system in an Electronic Trip Unit (ETU). An ETU includes a Protection Function (PF) and a Metering Function (MF), each of the PF and MF measuring in parallel the same one or more power line parameters. A comparator compares the first measurement and the second measurement and outputs a fault signal when a disagreement is detected with a given level of accuracy between the first measurement and the second measurement. At least one further comparator may be used that compares the first measurement and the second measurement, and a voter circuit that collects signals resulting from each said comparing and detects a fault when at least one fault signal exists among said collected signals.
申请公布号 WO2015047123(A1) 申请公布日期 2015.04.02
申请号 WO2013RU00836 申请日期 2013.09.25
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 DORRER, JOHANN;PARFENOV, STANISLAV SERGEYEVICH;VINOGRADOV, SERGEY VALERIEVICH;NIKOLAEV, MAXIM ALEXANDROVICH
分类号 H02H3/04;G01R31/327;G05B23/02;H01H47/00;H02H1/00;H02H3/05 主分类号 H02H3/04
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