发明名称 Double Sided NMOS/PMOS Structure and Methods of Forming the Same
摘要 A chip includes a dielectric layer having a top surface and a bottom surface, a first semiconductor layer overlying and bonded to the top surface of the dielectric layer, and a first Metal Oxide-Semiconductor (MOS) transistor of a first conductivity type. The first MOS transistor includes a first gate dielectric overlying and contacting the first semiconductor layer, and a first gate electrode overlying the first gate dielectric. A second semiconductor layer is underlying and bonded to the bottom surface of the dielectric layer. A second MOS transistor of a second conductivity type opposite to the first conductivity type includes a second gate dielectric underlying and contacting the second semiconductor layer, and a second gate electrode underlying the second gate dielectric.
申请公布号 US2015091066(A1) 申请公布日期 2015.04.02
申请号 US201314044643 申请日期 2013.10.02
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lee Jam-Wem
分类号 H01L27/092;H01L21/768;H01L29/04 主分类号 H01L27/092
代理机构 代理人
主权项 1. An integrated circuit structure comprising: a first chip comprising: a dielectric layer comprising a top surface and a bottom surface;a first semiconductor layer overlying and bonded to the top surface of the dielectric layer; a first Metal Oxide-Semiconductor (MOS) transistor of a first conductivity type, wherein the first MOS transistor comprises: a first gate dielectric overlying and contacting the first semiconductor layer; anda first gate electrode overlying the first gate dielectric; a second semiconductor layer underlying and bonded to the bottom surface of the dielectric layer; and a second MOS transistor of a second conductivity type opposite to the first conductivity type, wherein the second MOS transistor comprises: a second gate dielectric underlying and contacting the second semiconductor layer; anda second gate electrode underlying the second gate dielectric.
地址 Hsin-Chu TW