发明名称 PROCESSES FOR PASSIVATING DIELECTRIC FILMS
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for stably accumulating an upper electrode made of titanium nitride and the like on a surface of high-k film such as SrTixOy, BaTixOy, SrxBa(1-x)TiyOz, and SrBixTayOz used for an insulator with a metal-insulator-semiconductor (MIS) and metal-insulator-metal (MIM) structure, by a CVD method.SOLUTION: In a process, a substrate having a high-k layer is provided in a reaction chamber, and a chemical substance is provided into the reaction chamber under a gas phase state. The chemical compound containing fluorine is reacted with the high-k layer, and a passivation layer containing metal of fluorine and the high-k material is formed across the high-k layer. An electrode is deposited on the passivation layer. The passivation layer can protect a sensitive dielectric layer, thereby enabling deposition using precursors containing chlorine, bromine, and iodine over the passivation layer.</p>
申请公布号 JP2015061947(A) 申请公布日期 2015.04.02
申请号 JP20140203157 申请日期 2014.10.01
申请人 ASM INTERNATL NV 发明人 TOM E BLOMBERG;EVA E TOIS;ROBERT HUGGARE;JAN WILLEM MAES;VLADIMIR MACHKAOUTSAN;PIERRE DETER
分类号 C23C16/02;C23C16/34;C23C16/40;H01L21/28;H01L21/285;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/105;H01L27/108;H01L29/423;H01L29/49 主分类号 C23C16/02
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