发明名称 |
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME |
摘要 |
A semiconductor device includes a plurality of first insulating layers and a plurality of second layers alternately and vertically stacked on a substrate. Each of the plurality of second layers includes a horizontal electrode horizontally separated by a second insulating layer. A contact plug penetrates the plurality of first insulating layers and the second insulating layer of the plurality of second layers. |
申请公布号 |
US2015093865(A1) |
申请公布日期 |
2015.04.02 |
申请号 |
US201414563432 |
申请日期 |
2014.12.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SHIM SUNIL;CHO WONSEOK;LEE WOONKYUNG |
分类号 |
H01L27/115;H01L27/24 |
主分类号 |
H01L27/115 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of fabricating a semiconductor device, comprising:
alternately stacking a plurality of first insulating layers and a plurality of second insulating layers on a substrate; forming spaces between the plurality of second insulating layers by partially etching the plurality of second insulating layers, wherein the spaces are defined by the plurality of first insulating layers and remaining portions of the plurality of second insulating layers; forming horizontal electrodes in the spaces; and forming a contact structure penetrating the plurality of first insulating layers and the remaining portions of the plurality of second insulating layers. |
地址 |
Suwon-si KR |