发明名称 STRESS BUFFER LAYER FOR INTEGRATED MICROELECTROMECHANICAL SYSTEMS (MEMS)
摘要 Stress buffer layers for integrated microelectromechanical systems (MEMS) are described. For example, a semiconductor package includes a substrate having first and second surfaces, the second surface having an array of external conductive contacts. A microelectromechanical system (MEMS) component is disposed above the first surface of the substrate. A buffer layer is disposed above the MEMS component, the buffer layer having a first Young's modulus. A mold compound is disposed above the buffer layer, the mold compound having a second Young's modulus higher than the first Young's modulus.
申请公布号 US2015091167(A1) 申请公布日期 2015.04.02
申请号 US201314039157 申请日期 2013.09.27
申请人 Geissler Christian;Meyer Thorsten;Ofner Gerald;Mahnkopf Reinhard;Augustin Andreas;Mueller Christian 发明人 Geissler Christian;Meyer Thorsten;Ofner Gerald;Mahnkopf Reinhard;Augustin Andreas;Mueller Christian
分类号 B81C1/00;B81B7/00 主分类号 B81C1/00
代理机构 代理人
主权项 1. A semiconductor package, comprising: a substrate comprising first and second surfaces, the second surface comprising an array of external conductive contacts; a microelectromechanical system (MEMS) component disposed above the first surface of the substrate; a buffer layer disposed above the MEMS component, the buffer layer having a first Young's modulus; and a mold compound disposed above the buffer layer, the mold compound having a second Young's modulus higher than the first Young's modulus.
地址 Teugn DE