发明名称 Epitaxial growth of compound semiconductors using lattice-tuned domain-matching epitaxy
摘要 A method of epitaxially growing a final film using a crystalline substrate wherein the final film cannot be grown directly on the substrate surface is disclosed. The method includes forming a transition layer on the upper surface of the substrate. The transition layer has a lattice spacing that varies between its lower and upper surfaces. The lattice spacing at the lower surface matches the lattice spacing of the substrate to within a first lattice mismatch of 7%. The lattice spacing at the upper surface matches the lattice spacing of the final film to within a second lattice mismatch of 7%. The method also includes forming the final film on the upper surface of the transition layer.
申请公布号 US2015090180(A1) 申请公布日期 2015.04.02
申请号 US201314040326 申请日期 2013.09.27
申请人 Ultratech, Inc. 发明人 Hawryluk Andrew M.;Stearns Daniel
分类号 C30B25/18;C30B25/06;C30B29/10;C30B23/02;C30B29/40 主分类号 C30B25/18
代理机构 代理人
主权项 1. A method of epitaxially growing a desired film having a lattice spacing aF using a crystalline substrate having an upper surface and a lattice spacing as, the method comprising: forming on the upper surface of the substrate at least one transition layer having a lower surface, an upper surface, a thickness h, and a lattice spacing aT(z) that varies between the lower and upper surfaces such that the lattice spacing aT(0) at the lower surface satisfies m·aT(0)=n·as to within a first lattice mismatch of 7%, where n, m are integers, and the lattice spacing aT(h) at the upper surface satisfies the relationship i·aT(h)=j·aF to within a second lattice mismatch of within 7%, where i, j are integers; and forming the desired film on the upper surface of the transition layer.
地址 San Jose CA US
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