ACOUSTIC TESTING OF SAPPHIRE COMPONENTS FOR ELECTRONIC DEVICES

摘要

In some embodiments, processes for testing for structural flaws in sapphire parts such as display cover plates used in the manufacturing of electronic devices are disclosed. A process may include transmitting a destructive acoustic signal onto a sapphire part, and determining whether the sapphire part failed in response to the destructive signal. The destructive acoustic signal may include a Rayleigh acoustic wave, wherein the destructive acoustic signal breaks the sapphire part if the sapphire part has a surface flaw larger than a specified size. In this manner, only sapphire parts that can withstand the destructive acoustic signal are used in manufacturing of the electronic device.

主权项

1. A process for testing for structural flaws in sapphire parts used in the manufacturing of electronic devices, comprising:
transmitting a destructive acoustic signal onto a sapphire part; and determining whether the sapphire part mechanically failed in response to the transmitting of the destructive acoustic signal.