发明名称 DEVICES AND METHODS OF FORMING FINFETS WITH SELF ALIGNED FIN FORMATION
摘要 Devices and methods for forming semiconductor devices with FinFETs are provided. One method includes, for instance: obtaining an intermediate semiconductor device with a substrate and at least one shallow trench isolation region; depositing a hard mask layer over the intermediate semiconductor device; etching the hard mask layer to form at least one fin hard mask; and depositing at least one sacrificial gate structure over the at least one fin hard mask and at least a portion of the substrate. One intermediate semiconductor device includes, for instance: a substrate with at least one shallow trench isolation region; at least one fin hard mask over the substrate; at least one sacrificial gate structure over the at least one fin hard mask; at least one spacer disposed on the at least one sacrificial gate structure; and at least one pFET region and at least one nFET region grown into the substrate.
申请公布号 US2015091094(A1) 申请公布日期 2015.04.02
申请号 US201314043243 申请日期 2013.10.01
申请人 GLOBALFOUNDRIES Inc. 发明人 WAN Jing;WEI Andy;ZHAO Lun;YANG Dae Geun;LIU Jin Ping;LUO Tien-Ying;BOUCHE Guillaume;HARIHARAPUTHIRAN Mariappan;GAIRE Churamani
分类号 H01L27/12;H01L21/762;H01L21/84 主分类号 H01L27/12
代理机构 代理人
主权项 1. A method comprising: obtaining an intermediate semiconductor device, comprising: a substrate with at least one shallow trench isolation region; depositing a hard mask layer over the intermediate semiconductor device; etching the hard mask layer to form at least one fin hard mask; and depositing at least one sacrificial gate structure over the at least one fin hard mask and at least a portion of the substrate.
地址 Grand Cayman KY