发明名称 薄膜形成方法、薄膜形成装置及びプログラム
摘要 <p>A control unit heats a reaction pipe to a load temperature by controlling a temperature-raising heater 16, and then makes semiconductor wafers received in the reaction pipe. Next, the control unit heats the reaction pipe in which the semiconductor wafers are received to a film formation temperature by controlling the temperature-raising heater, and then forms thin films on the semiconductor wafers by supplying a film forming gas into the reaction pipe from a process gas introducing pipe. Also, the control unit sets the load temperature to a temperature higher than the film formation temperature.</p>
申请公布号 JP5692850(B2) 申请公布日期 2015.04.01
申请号 JP20100293816 申请日期 2010.12.28
申请人 发明人
分类号 H01L21/31;C23C16/42;C23C16/46;H01L21/316 主分类号 H01L21/31
代理机构 代理人
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