发明名称 UNIVERSAL MULTI-DETECTION SYSTEM FOR MICROPLATES
摘要 An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.
申请公布号 EP2852820(A1) 申请公布日期 2015.04.01
申请号 EP20130797139 申请日期 2013.05.30
申请人 BTI HOLDINGS, INC. 发明人 ZIMENKOV, OLEG;AMOURETTI, XAVIER;KONTOROVICH, MICHAEL;NORRIS, BEN;SEARS, RICHARD N.;VENDITTI, JR., DAN J.;MANY, CHRISTOPHER;ANDERSON, BILL;KNIGHT, BEN;PIETTE, JAMES;PIETTE, ROSS;TOBEY, JOE;FERRIS, BRIAN
分类号 G01N21/64;G01J3/44;G01N21/25;G01N21/76 主分类号 G01N21/64
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