发明名称 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
摘要 <p>An apparatus for processing reaction products that are deposited when an etching target film contained in a target object to be processed is etched is provided with: a processing chamber; a partition plate; a plasma source; a mounting table; a first processing gas supply unit; a second processing gas supply unit. The processing chamber defines a space, and the partition plate is arranged within the processing chamber and divides the space into a plasma generating space and a substrate processing space, while suppressing permeation of ions and vacuum ultraviolet rays. The plasma source generates a plasma in the plasma forming space. The mounting table is arranged in the substrate processing space to mount the target object thereon.</p>
申请公布号 EP2854160(A1) 申请公布日期 2015.04.01
申请号 EP20130794483 申请日期 2013.04.16
申请人 TOKYO ELECTRON LIMITED 发明人 NISHIMURA EIICHI;SHIMIZU AKITAKA;YAMASHITA FUMIKO;URAYAMA DAISUKE
分类号 H01L21/3065;H01J37/32 主分类号 H01L21/3065
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