High-frequency cobra probe

摘要

A test device including cobra probes and a method of manufacturing is disclosed. The test device includes a conductive upper plate having an upper guide hole and a conductive lower plate having a lower guide hole. The test device also includes a conductive cobra probe disposed between the upper guide hole of the upper plate and the lower guide hole of the lower plate. A dielectric material insulates the cobra probe from the upper plate and the lower plate.

主权项

1. A test device, comprising
a conductive upper plate having an upper guide hole; a conductive lower plate having a lower guide hole; a conductive cobra probe disposed between the upper guide hole of the upper plate and the lower guide hole of the lower plate; one or more dummy probes flanking the cobra probe; and a dielectric material insulating the cobra probe from the upper plate and the lower plate, wherein: a lower end of the one or more dummy probes is contacting an interior surface of the lower plate; the lower plate is connected to an electrical ground; and an upper end of the one or more dummy probes is electrically grounded.