Semiconductor device and detection method thereof

摘要

A semiconductor device and a detection method thereof are provided. The semiconductor device includes a resistor terminal, a dummy pull up driver, a comparator and a detection state machine. The resistor terminal is connected to an external resistor. The dummy pull up driver provides driving operations of 20 to 2N+1−1 stages, wherein N is a natural number. The comparator outputs a comparison signal in response to a test voltage and a reference voltage. The detection state machine controls the driving operation of the dummy pull up driver to generate and output a detection signal according to the comparison signal. The detection signal indicates an electric connection state of the resistor terminal is a connecting state of an operation voltage or a floating state, a connecting state of the external resistor, or a connecting state of a ground voltage.

主权项

1. A semiconductor device, comprising:
a resistor terminal, configured to connect to an external resistor; a dummy pull up driver, coupled to an operation voltage and the resistor terminal, wherein the dummy pull up driver provides driving operations of 20 stage to 2N+1−1 stage, where N is a natural number; a comparator, outputting a comparison signal in response to a test voltage and a reference voltage, wherein the test voltage is generated at a coupling contact of the resistor terminal and the dummy pull up driver; and a detection state machine, coupled to an output terminal of the comparator and the dummy pull up driver, wherein the detection state machine controls the driving operation of the dummy pull up driver to generate and output a detection signal according to the comparison signal, and the detection signal is configured to indicate an electric connection state of the resistor terminal is a connecting state of the operation voltage or a floating state, a connecting state of the external resistor, or a connecting state of a ground voltage.