发明名称 Semiconductor device with SEG film active region
摘要 A semiconductor device and a method for manufacturing the same are provided. A barrier film is formed in a device separating structure, and the device separating structure is etched at a predetermined thickness to expose a semiconductor substrate. Then, a SEG film is grown to form an active region whose area is increased. As a result, a current driving power of a transistor located at a cell region and peripheral circuit regions is improved.
申请公布号 US8994143(B2) 申请公布日期 2015.03.31
申请号 US201213551483 申请日期 2012.07.17
申请人 Hynix Semiconductor Inc. 发明人 Kim Young Bog
分类号 H01L29/00;H01L29/76;H01L29/94;H01L23/58;H01L29/66;H01L21/762 主分类号 H01L29/00
代理机构 代理人
主权项 1. A semiconductor device comprising: a first device separating structure that defines a first active region, wherein an upper surface of the first device separating structure is lower than an upper surface of the first active region, such that a side surface of an upper portion of the first active region does not contact the first device separating structure; a second device separating structure that defines a second active region extending from a side surface of the upper portion of the first active region, wherein the second device separating structure and the second active region are disposed over the first device separating structure; a line-type barrier film extended along a first major direction of the semiconductor device; and a recess gate formed in a recess defined in the first active region along a second major direction perpendicular to the first major direction, wherein the line-type barrier film separates two neighboring second active regions.
地址 Icheon KR