发明名称 |
Semiconductor device with SEG film active region |
摘要 |
A semiconductor device and a method for manufacturing the same are provided. A barrier film is formed in a device separating structure, and the device separating structure is etched at a predetermined thickness to expose a semiconductor substrate. Then, a SEG film is grown to form an active region whose area is increased. As a result, a current driving power of a transistor located at a cell region and peripheral circuit regions is improved. |
申请公布号 |
US8994143(B2) |
申请公布日期 |
2015.03.31 |
申请号 |
US201213551483 |
申请日期 |
2012.07.17 |
申请人 |
Hynix Semiconductor Inc. |
发明人 |
Kim Young Bog |
分类号 |
H01L29/00;H01L29/76;H01L29/94;H01L23/58;H01L29/66;H01L21/762 |
主分类号 |
H01L29/00 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a first device separating structure that defines a first active region, wherein an upper surface of the first device separating structure is lower than an upper surface of the first active region, such that a side surface of an upper portion of the first active region does not contact the first device separating structure; a second device separating structure that defines a second active region extending from a side surface of the upper portion of the first active region, wherein the second device separating structure and the second active region are disposed over the first device separating structure; a line-type barrier film extended along a first major direction of the semiconductor device; and a recess gate formed in a recess defined in the first active region along a second major direction perpendicular to the first major direction, wherein the line-type barrier film separates two neighboring second active regions. |
地址 |
Icheon KR |