Test systems with a probe apparatus and index mechanism

摘要

A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.

主权项

1. A system for testing a device under test, comprising:
a circuit board having a pattern of signal contacts and a pattern of guard contacts, the circuit board is configured as a plate having a top side, a bottom side, and an opening through the top and bottom sides; a probe card including a wire guide, a probe tile connected with the wire guide, a plurality of probe wires supported by the wire guide and probe tile, the probe wires are positioned through the wire guide and the probe tile, the probe wires include a probe tip extending through the probe tile, the probe tips forming an array to probe the device under test, the probe wires including a signal transmitting portion and a guard portion exposed from the wire guide, the signal transmitting portions and the guard portions form a contact pattern and, with the array, are disposed on one side of the probe card, and a retainer member is disposed on another side of the probe card; a holder having multiple probe card stations, the probe card stations have a connector structure to connect to and disconnect from the retainer member of the probe card, and to allow the probe card to both contact the circuit board and the device under test; and a carriage mechanism configured to position the probe card onto the circuit board, the carriage mechanism to position any of the probe card stations to allow connection to and disconnection from other probe cards, to interchange among the probe card and the other probe cards, and to position one or more of the other probe cards to contact the circuit board, wherein the probe tile is insertable into the opening of the circuit board to allow the array to probe the device under test, and the contact pattern of the probe card is contactable with the pattern of signal contacts and guard contacts on the circuit board, such contact of the probe card with the circuit board allows signals to be transferred through the probe wires and circuit board.