发明名称 |
Method for manufacturing an opto-microelectronic device |
摘要 |
Method for manufacturing a microelectronic device from a first substrate (10), including the production of at least one electronic component in the semi-conductor substrate after transferring the first substrate (10) onto a second substrate (20), characterized in that it comprises:
a first phase carried out prior to the transfer, and including forming at least one pattern made of a sacrificial material in a layer of the first substrate (10),a second phase carried out after the transfer and including the substitution of the electronic component for the pattern. |
申请公布号 |
US8993368(B2) |
申请公布日期 |
2015.03.31 |
申请号 |
US201214111458 |
申请日期 |
2012.04.11 |
申请人 |
Commissariat a l'Energie Atomique et aux Energies Alternatives |
发明人 |
Rossini Umberto |
分类号 |
H01L21/00;H01L27/146;G02F1/1362;H01L27/12 |
主分类号 |
H01L21/00 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A method for manufacturing an opto-microelectronic device from a first semiconductor substrate, comprising the production of at least one electrode of a pixel after a transfer of the first semiconductor substrate onto a second substrate, the method comprising:
a first phase carried out before the transfer and comprising: i) forming at least one pattern made of a sacrificial material in a layer formed in the first substrate surface, ii) a lateral delimitation of the at least one pattern in the layer of the first substrate surface by an edge of a boundary material differing from the sacrificial material, a second phase carried out after the transfer and comprising a substitution of the electrode for the pattern including a removal of the sacrificial material of the pattern by a selective etching so configured as to attack the sacrificial material of the pattern and to preserve the boundary material without using photolithography. |
地址 |
Paris FR |