发明名称 Method for manufacturing an opto-microelectronic device
摘要 Method for manufacturing a microelectronic device from a first substrate (10), including the production of at least one electronic component in the semi-conductor substrate after transferring the first substrate (10) onto a second substrate (20), characterized in that it comprises: a first phase carried out prior to the transfer, and including forming at least one pattern made of a sacrificial material in a layer of the first substrate (10),a second phase carried out after the transfer and including the substitution of the electronic component for the pattern.
申请公布号 US8993368(B2) 申请公布日期 2015.03.31
申请号 US201214111458 申请日期 2012.04.11
申请人 Commissariat a l'Energie Atomique et aux Energies Alternatives 发明人 Rossini Umberto
分类号 H01L21/00;H01L27/146;G02F1/1362;H01L27/12 主分类号 H01L21/00
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A method for manufacturing an opto-microelectronic device from a first semiconductor substrate, comprising the production of at least one electrode of a pixel after a transfer of the first semiconductor substrate onto a second substrate, the method comprising: a first phase carried out before the transfer and comprising: i) forming at least one pattern made of a sacrificial material in a layer formed in the first substrate surface, ii) a lateral delimitation of the at least one pattern in the layer of the first substrate surface by an edge of a boundary material differing from the sacrificial material, a second phase carried out after the transfer and comprising a substitution of the electrode for the pattern including a removal of the sacrificial material of the pattern by a selective etching so configured as to attack the sacrificial material of the pattern and to preserve the boundary material without using photolithography.
地址 Paris FR