发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To efficiently perform a writing operation in a semiconductor memory device including a variable resistance element.SOLUTION: A semiconductor memory device includes a memory cell MC and a control circuit for writing data in the memory cell MC. The memory cell MC includes: a first electrode 20; a first resistance change layer 22 formed on the first electrode 20; a second resistance change layer 24 formed on the first resistance change layer 22 and having a smaller resistance value than the first resistance change layer 22; a third resistance change layer 26 formed on the second resistance change layer 24 and having a larger resistance value than the second resistance change layer 24; and a second electrode 28 formed on the third resistance change layer 26. The control circuit applies a first voltage pulse P1 to the memory cell, and then applies a second voltage pulse P2 having the same polarity as the first voltage pulse P1 and having a shorter rise time than the first voltage pulse P1 to the memory cell.</p> |
申请公布号 |
JP2015060943(A) |
申请公布日期 |
2015.03.30 |
申请号 |
JP20130193540 |
申请日期 |
2013.09.18 |
申请人 |
TOSHIBA CORP |
发明人 |
ICHIHARA REIKA;FUJII AKISUKE;MIYAGAWA HIDENORI;ISHIKAWA TAKAYUKI |
分类号 |
H01L27/105;G11C13/00;H01L45/00;H01L49/00 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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