发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which inhibits a leakage current occurring between a contact plug and a neighboring bit line.SOLUTION: A semiconductor device comprises: a semiconductor substrate 1; a first contact plug 6 which has a diameter size at an upper end larger than a diameter size at a lower end; a first insulation film 4 which covers the first contact plug 6; a second contact plug 9 with a lower end being joined to the upper end of the first contact plug 6 and which has a diameter size at an upper end smaller than a diameter size at the lower end; a second insulation film 7 which covers the second contact plug 9; a wiring layer 13 with a lower end being joined to the upper end of the second contact plug 9; third insulation films 10, 11 which cover the wiring layer 13; and a stepped part 6a formed at a part of the upper end of the first contact plug 6, where the lower end of the second contact plug 9 does not cover.
申请公布号 JP2015060918(A) 申请公布日期 2015.03.30
申请号 JP20130192994 申请日期 2013.09.18
申请人 TOSHIBA CORP 发明人 KANEKO HAJIME;SHIMADA KEIICHI;USUI TAKAMASA
分类号 H01L21/8247;H01L21/3205;H01L21/336;H01L21/768;H01L23/522;H01L23/532;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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