| 摘要 |
PROBLEM TO BE SOLVED: To prevent the reduction of auto-focus accuracy.SOLUTION: A solid state imaging device includes: a plurality of mutually adjacent phase difference detection pixels; and a separation structure disposed to separate light incident on each light-receiving section of the plurality of phase difference detection pixels. The separation structure has an inclination on a sidewall face, so that the cross section has a taper shape. The present invention is applicable to, for example, a rear surface irradiation type CMOS image sensor and a surface irradiation type CMOS image sensor. |
