发明名称 APPARATUS FOR MONITORING SECONDARY RESONANCE OF QUARTZ-CRYSTAL RESONATORS
摘要 FIELD: radio engineering, communication.SUBSTANCE: invention relates to radio-measurement equipment and can be used in developing and inspecting quartz-crystal resonators and frequency-controlled (modulated) quartz-crystal oscillators. The apparatus consists of the following components: an electronically controlled generator (1), a four-terminal device (2) with a quartz-crystal resonator, a unit (3) for electronic control of the wattles component of the four-terminal device, a frequency multiplier (4), a frequency detector (5), a display (6), a phase modulator (7), an integrator (8), a high-pass filter (9), a low-pass filter (10), an attenuator (11), a modulating square-wave generator (12).EFFECT: faster determination of secondary resonance of quartz-crystal resonators.2 dwg
申请公布号 RU1841056(C) 申请公布日期 2015.03.27
申请号 SU19823048208 申请日期 1982.08.13
申请人 GOSUDARSTVENNOE PREDPRIJATIE "NAUCHNO-ISSLEDOVATEL'SKIJ INSTITUT "KVANT" 发明人 VOLOSHIN A.P.;NIKITENKO JU.G.;RESHETNJAK V.K.;SUBBOTOVICH I.N.;FEDJAEV N.I.
分类号 G01R27/00 主分类号 G01R27/00
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