发明名称 |
COLONY EXAMINATION PROGRAM, COLONY EXAMINATION DEVICE, AND COLONY EXAMINATION METHOD |
摘要 |
This colony examination device (100) acquires information for each of a plurality of specimens wherein bacterial colonies are included which identifies each specimen. In each respective instance of the acquired information which identifies the specimens, the colony examination device (100) further arranges the information which identifies the specimens, on the basis of time required for the specimen to travel from a facility which fabricated the specimens and arrive at a destination which ships product represented by the specimens. Additionally, the colony examination device (100) displays a list of the arranged information which identifies the specimens. |
申请公布号 |
WO2015040678(A1) |
申请公布日期 |
2015.03.26 |
申请号 |
WO2013JP75059 |
申请日期 |
2013.09.17 |
申请人 |
FUJITSU LIMITED |
发明人 |
HIDAKA, KOUICHI;NAITO, HIROHISA;HAYASHI, MIMIKO;SAGA, SUSUMU;MIYAJIMA, SACHIKO;KAWANO, KIYOSHI;MIYAZAKI, AKIRA |
分类号 |
G06Q50/22 |
主分类号 |
G06Q50/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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