发明名称 SECONDARY CELL DEGRADATION DIAGNOSIS SYSTEM, AND DEGRADATION DIAGNOSIS METHOD
摘要 [Problem] To accurately diagnose the condition of a secondary cell. [Solution] An embodiment of the present invention is provided with: a feature value calculation unit for reading relation data representing the relationship between the ratio of the amount of change in the voltage of a secondary cell to the amount of change in the amount of charge in the secondary cell and either the voltage of the secondary cell or the amount of charge in the secondary cell, specifying the voltage or the amount of charge at which the relationship with the ratio satisfies a predetermined condition on the basis of the relation data, and calculating a feature value for the secondary cell from the relationship data using the specified voltage or amount of charge as a reference; and a degradation diagnosis unit for diagnosing degradation in the secondary cell on the basis of the feature value.
申请公布号 WO2015041091(A1) 申请公布日期 2015.03.26
申请号 WO2014JP73684 申请日期 2014.09.08
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HANYU YUKI;YAMAMOTO TAKAHIRO
分类号 H01M10/48;G01R31/36;H01M10/42 主分类号 H01M10/48
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