发明名称 NONDESTRUCTIVE TESTING ACTIVE THERMOGRAPHY SYSTEM AND METHOD FOR UTILIZING THE SAME
摘要 <p>An assembly including an optically excited infrared nondestructive testing active thermography system (10) is disclosed. The optically excited infrared nondestructive testing active thermography system (10) includes one or more illumination sources (12), at least one first reflector (18), at least one second reflector (20) and a computing resource (16). The at least one first reflector (18) is arranged about the one or more illumination sources (12). The at least one first reflector (18) has a near focal point (FN) and a far focal point (Fp). The one or more illumination sources (12) is/are positioned at least proximate the near focal point (FN) of the at least one first reflector (18). The at least one second reflector (20) is positioned at least proximate the far focal point (FF). The computing resource (16) is communicatively-coupled to a motor (30) that is coupled to the at least one second reflector (20) for manipulating the at least one second reflector (20) between at least: a first spatial orientation and a second spatial orientation. At least one of the first spatial orientation and the second spatial orientation results in the at least one second reflector (20) reflecting light (L) that originates from the one or more illumination sources (12). The light (L) is directed toward the at least one second reflector (20) as a result of the light (L) being directly propagated from the one or more illumination sources (12) and reflected by the at least one first reflector (18). A method is also disclosed.</p>
申请公布号 WO2015042577(A1) 申请公布日期 2015.03.26
申请号 WO2014US56973 申请日期 2014.09.23
申请人 THERMAL WAVE IMAGING, INC. 发明人 SHEPARD, STEVEN, M.;YOUNG, TIMOTHY;BEEMER, MARIA, FRENDBERG
分类号 G01N25/72 主分类号 G01N25/72
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